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High resolution extended image near field optics

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Copyright (c) Malcolm Kemp 2010

 

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References

 

Aharonov, Y., Albert, D.Z. and Vaidman, L. (1986). How the result of a measurement of a component of a spin one-half particle can turn out to be 100? L. Phys. Rev. Lett. 60, 1351-1354

 

Born, M. and Wolf, E. (1980). Principles of Optics, 6th edition. Cambridge University Press

 

Ito, T. and Okazaki, S. (2000). Pushing the limits of lithography. Nature, 406, 1027-1031

 

Kemp, M.H.D. (2001). Ultra-high resolution imaging devices, PCT Patent Application PCT/GB2001/01161

 

Kemp, M.H.D. (2003). Optical Imaging Device Design for Solar Powered Flight and Power Generation, PCT Patent Application PCT/GB2003/004516

 

Starling, D.J., Dixon, P.B., Jordan, A.N. and Howell, J.C. (2009). Optimizing the Signal to Noise Ratio of a Beam Deflection Measurement with Interferometric Weak Values. Phys. Rev A, 90, 041803(R)

 

Steinberg, A.M. (2010). A light touch. Nature, 463, 890-891

 


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